丝印：ABT18652；Package：LQFP；SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER

Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for

文件：438.5 Kbytes 页数：16 Pages

TI

德州仪器

SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER

Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for

文件：441.92 Kbytes 页数：17 Pages

TI

德州仪器

SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS

文件：169.97 Kbytes 页数：11 Pages

TI

德州仪器

Package：64-LQFP；包装：卷带（TR）剪切带（CT）Digi-Reel® 得捷定制卷带 类别：集成电路（IC） 专用逻辑器件 描述：IC SCAN-TEST-DEV/TXRX 64-LQFP

TI

德州仪器