SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER

Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for

文件：438.5 Kbytes 页数：16 Pages

TI

德州仪器

SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER

Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for

文件：441.92 Kbytes 页数：17 Pages

TI

德州仪器

SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS

文件：169.97 Kbytes 页数：11 Pages

TI

德州仪器

具有 18 位总线收发器和寄存器的扫描测试设备

This scan test device with an 18-bit bus transceiver and register is a member of the Texas Instruments SCOPE™ testability IC family. This device supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished vi • Member of the Texas Instruments Widebus™ Family\n• Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data\n• SCOPE™ Instruction Set \n• Parallel Signature Analysis at Inputs With Masking Option\n• Sample Inputs/Toggle Outputs\n• Device Ide;

TI

德州仪器

SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER

Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for

文件：441.92 Kbytes 页数：17 Pages

TI

德州仪器

SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER

Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for

文件：441.92 Kbytes 页数：17 Pages

TI

德州仪器

丝印：ABT18652；Package：LQFP；SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER

Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for

文件：438.5 Kbytes 页数：16 Pages

TI

德州仪器

丝印：ABT18652；Package：LQFP；SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER

Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for

文件：438.5 Kbytes 页数：16 Pages

TI

德州仪器

SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER

Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for

文件：441.92 Kbytes 页数：17 Pages

TI

德州仪器

SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER

Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for

文件：441.92 Kbytes 页数：17 Pages

TI

德州仪器