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SN74ABT18652PM

SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER

Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for

文件:441.92 Kbytes 页数:17 Pages

TI

德州仪器

SN74ABT18652PM

丝印:ABT18652;Package:LQFP;SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER

Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for

文件:438.5 Kbytes 页数:16 Pages

TI

德州仪器

SN74ABT18652PM

SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS

文件:169.97 Kbytes 页数:11 Pages

TI

德州仪器

SN74ABT18652PM.B

丝印:ABT18652;Package:LQFP;SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER

Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for

文件:438.5 Kbytes 页数:16 Pages

TI

德州仪器

SN74ABT18652PM.B

SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER

Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for

文件:441.92 Kbytes 页数:17 Pages

TI

德州仪器

SN74ABT18652PMG4

SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER

Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for

文件:441.92 Kbytes 页数:17 Pages

TI

德州仪器

SN74ABT18652PMG4.B

SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER

Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for

文件:441.92 Kbytes 页数:17 Pages

TI

德州仪器

SN74ABT18652PMG4.B

丝印:ABT18652;Package:LQFP;SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER

Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for

文件:438.5 Kbytes 页数:16 Pages

TI

德州仪器

SN74ABT18652PM

Package:64-LQFP;包装:卷带(TR)剪切带(CT)Digi-Reel® 得捷定制卷带 类别:集成电路(IC) 专用逻辑器件 描述:IC SCAN-TEST-DEV/TXRX 64-LQFP

TI

德州仪器

产品属性

  • 产品编号:

    SN74ABT18652PM

  • 制造商:

    Texas Instruments

  • 类别:

    集成电路(IC) > 专用逻辑器件

  • 系列:

    74ABT

  • 包装:

    卷带(TR)剪切带(CT)Digi-Reel® 得捷定制卷带

  • 逻辑类型:

    扫描测试设备,带收发器和寄存器

  • 供电电压:

    4.5V ~ 5.5V

  • 位数:

    18

  • 工作温度:

    -40°C ~ 85°C

  • 安装类型:

    表面贴装型

  • 封装/外壳:

    64-LQFP

  • 供应商器件封装:

    64-LQFP(10x10)

  • 描述:

    IC SCAN-TEST-DEV/TXRX 64-LQFP

供应商型号品牌批号封装库存备注价格
TexasInstruments
18+
ICSCAN-TEST-DEV/TXRX64-L
6800
公司原装现货/欢迎来电咨询!
询价
Texas Instruments
24+
64-LQFP(10x10)
56200
一级代理/放心采购
询价
TI
25+
QFP-64
932
就找我吧!--邀您体验愉快问购元件!
询价
TI(德州仪器)
2021+
LQFP-64(10x10)
499
询价
TI/德州仪器
24+
LQFP-64
9600
原装现货,优势供应,支持实单!
询价
TI
23+
N/A
7560
原厂原装
询价
22+
NA
357
加我QQ或微信咨询更多详细信息,
询价
TI
22+
64LQFP
9000
原厂渠道,现货配单
询价
TI/德州仪器
25+
LQFP-64
30000
公司只有原装
询价
TI(德州仪器)
25+
LQFP64(10x10)
1588
原装现货,免费供样,技术支持,原厂对接
询价
更多SN74ABT18652PM供应商 更新时间2026-1-30 8:30:00