SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments Widebus Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Include D-Type Flip-Flops and Control Circuitry to Provide Multiplex

文件：830.88 Kbytes 页数：42 Pages

TI

德州仪器

SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS

文件：575.5 Kbytes 页数：37 Pages

TI

德州仪器

SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS

文件：580.25 Kbytes 页数：39 Pages

TI

德州仪器

SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS

文件：575.5 Kbytes 页数：37 Pages

TI

德州仪器