High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

文件：527.93 Kbytes 页数：21 Pages

NSCNational Semiconductor (TI)

美国国家半导体美国国家半导体公司

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

文件：1.45073 Mbytes 页数：29 Pages

TI

德州仪器

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

文件：1.45073 Mbytes 页数：29 Pages

TI

德州仪器

30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

文件：474.73 Kbytes 页数：21 Pages

NSCNational Semiconductor (TI)

美国国家半导体美国国家半导体公司

SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

文件：906.75 Kbytes 页数：27 Pages

TI

德州仪器

SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

文件：906.75 Kbytes 页数：27 Pages

TI

德州仪器

具有 IEEE 1149.1 测试访问的高温 20 至 80MHz 10 位解串器

The SCAN921025H transforms a 10-bit wide parallel LVCMOS/LVTTL data bus into a single high speed Bus LVDS serial data stream with embedded clock. The SCAN921226H receives the Bus LVDS serial data stream and transforms it back into a 10-bit wide parallel data bus and recovers parallel clock.Both devi • High Temperature Operation to 125°C\n• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode\n• Clock Recovery from PLL Lock to Random Data Patterns\n• Ensured Transition Every Data Transfer Cycle\n• Chipset (Tx + Rx) Power Consumption;

TI

德州仪器

串行器/解串器 - Serdes 30-80 MHz 10 Bit Bus LVDS Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 49-NFBGA

TI

德州仪器

Package：49-LFBGA；包装：卷带（TR）剪切带（CT）Digi-Reel® 得捷定制卷带 功能：解串器 类别：集成电路（IC） 串行器，解串器 描述：IC SER/DESER HI TEMP 80MHZ LVDS

TI2

德州仪器

Package：49-LFBGA；包装：卷带（TR） 功能：解串器 类别：集成电路（IC） 串行器，解串器 描述：IC SERDES LVDS 10BIT BUS 49-FBGA

TI2

德州仪器