丝印：RM48L950DPGET；Package：LQFP(PGE)；RM48Lx50 16- and 32-Bit RISC Flash Microcontroller

1.1 Features 1 • High-Performance Microcontroller for Safety- Critical Applications – Dual CPUs Running in Lockstep – ECC on Flash and RAM Interfaces – Built-In Self-Test (BIST) for CPU and On-chip RAMs – Error Signaling Module With Error Pin – Voltage and Clock Monitoring • ARM® Cortex®-

文件：8.99008 Mbytes 页数：182 Pages

TI

德州仪器

16- and 32-Bit RISC Flash Microcontroller

文件：8.83058 Mbytes 页数：179 Pages

TI

德州仪器

丝印：RM48L950DPGET；Package：LQFP(PGE)；RM48Lx50 16- and 32-Bit RISC Flash Microcontroller

1.1 Features 1 • High-Performance Microcontroller for Safety- Critical Applications – Dual CPUs Running in Lockstep – ECC on Flash and RAM Interfaces – Built-In Self-Test (BIST) for CPU and On-chip RAMs – Error Signaling Module With Error Pin – Voltage and Clock Monitoring • ARM® Cortex®-

文件：8.99008 Mbytes 页数：182 Pages

TI

德州仪器

丝印：RM48L950DPGET；Package：LQFP(PGE)；RM48Lx50 16- and 32-Bit RISC Flash Microcontroller

1.1 Features 1 • High-Performance Microcontroller for Safety- Critical Applications – Dual CPUs Running in Lockstep – ECC on Flash and RAM Interfaces – Built-In Self-Test (BIST) for CPU and On-chip RAMs – Error Signaling Module With Error Pin – Voltage and Clock Monitoring • ARM® Cortex®-

文件：8.99008 Mbytes 页数：182 Pages

TI

德州仪器

丝印：RM48L950DPGET；Package：LQFP(PGE)；RM48Lx50 16- and 32-Bit RISC Flash Microcontroller

1.1 Features 1 • High-Performance Microcontroller for Safety- Critical Applications – Dual CPUs Running in Lockstep – ECC on Flash and RAM Interfaces – Built-In Self-Test (BIST) for CPU and On-chip RAMs – Error Signaling Module With Error Pin – Voltage and Clock Monitoring • ARM® Cortex®-

文件：8.99008 Mbytes 页数：182 Pages

TI

德州仪器