丝印：LVTH18514；Package：TSSOP；3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments (TIE) SCOPE E Family of Testability Products
Members of the TI WidebusE Family
State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC)
Support Unregulated Battery Operation Down to 2.7 V

文件：643.29 Kbytes 页数：37 Pages

TI

德州仪器

丝印：LVTH18514；Package：TSSOP；3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments (TIE) SCOPE E Family of Testability Products
Members of the TI WidebusE Family
State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC)
Support Unregulated Battery Operation Down to 2.7 V

文件：643.29 Kbytes 页数：37 Pages

TI

德州仪器

丝印：LVTH18514；Package：TSSOP；3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments (TIE) SCOPE E Family of Testability Products Members of the TI WidebusE Family State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) Support Unregulated Battery Operation Down to 2.7 V UBT E (U

文件：642.76 Kbytes 页数：37 Pages

TI

德州仪器

丝印：LVTH18514；Package：TSSOP；3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments (TIE) SCOPE E Family of Testability Products
Members of the TI WidebusE Family
State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC)
Support Unregulated Battery Operation Down to 2.7 V

文件：643.29 Kbytes 页数：37 Pages

TI

德州仪器