丝印：CD4011UBF；Package：CDIP；CMOS Quad 2-Input NAND Gate

Features: Propagation delay time = 30 ns (typ). at CL=50pF, Vpp=10V Standardized symmetrical output characteristics = 100% tested for quiescent current at 20V Maximum input current of 1 uA at 18 V over full package temperature range; 100 nA at 18 V and 25°C = 5.V, 10-V, and 15-V p

文件：978 Kbytes 页数：20 Pages

TI

德州仪器

丝印：CD4011UBF；Package：CDIP；CMOS Quad 2-Input NAND Gate

Features: Propagation delay time = 30 ns (typ). at CL=50pF, Vpp=10V Standardized symmetrical output characteristics = 100% tested for quiescent current at 20V Maximum input current of 1 uA at 18 V over full package temperature range; 100 nA at 18 V and 25°C = 5.V, 10-V, and 15-V p

文件：978 Kbytes 页数：20 Pages

TI

德州仪器

丝印：CD4011UBF；Package：CDIP；CMOS Quad 2-Input NAND Gate

Features: Propagation delay time = 30 ns (typ). at CL=50pF, Vpp=10V Standardized symmetrical output characteristics = 100% tested for quiescent current at 20V Maximum input current of 1 uA at 18 V over full package temperature range; 100 nA at 18 V and 25°C = 5.V, 10-V, and 15-V p

文件：978 Kbytes 页数：20 Pages

TI

德州仪器

丝印：CD4011UBF；Package：CDIP；CMOS Quad 2-Input NAND Gate

Features: Propagation delay time = 30 ns (typ). at CL=50pF, Vpp=10V Standardized symmetrical output characteristics = 100% tested for quiescent current at 20V Maximum input current of 1 uA at 18 V over full package temperature range; 100 nA at 18 V and 25°C = 5.V, 10-V, and 15-V p

文件：978 Kbytes 页数：20 Pages

TI

德州仪器

CMOS Quad 2-Input NAND Gate

文件：922.77 Kbytes 页数：15 Pages

TI

德州仪器

CMOS Quad 2-input NAND Gate

文件：931.97 Kbytes 页数：15 Pages

TI

德州仪器