丝印：CD4011B；Package：SOP；CMOS NAND GATES

Features: Propagation delay time = 60 ns (typ.) at CL =50 pF, Vpp = 10V = Buffered inputs and outputs = Standardized symmetrical output characteristics Maximum input current of 1 uA at 18 V over full package temperature range; 100 nA at 18 V and 25°C = 100% tested for quiescent curre

文件：1.0201 Mbytes 页数：23 Pages

TI

德州仪器

丝印：CD4011B；Package：SOP；CMOS NAND GATES

Features: Propagation delay time = 60 ns (typ.) at CL =50 pF, Vpp = 10V = Buffered inputs and outputs = Standardized symmetrical output characteristics Maximum input current of 1 uA at 18 V over full package temperature range; 100 nA at 18 V and 25°C = 100% tested for quiescent curre

文件：1.0201 Mbytes 页数：23 Pages

TI

德州仪器

丝印：CD4011BE；Package：PDIP；CMOS NAND GATES

Features: Propagation delay time = 60 ns (typ.) at CL =50 pF, Vpp = 10V = Buffered inputs and outputs = Standardized symmetrical output characteristics Maximum input current of 1 uA at 18 V over full package temperature range; 100 nA at 18 V and 25°C = 100% tested for quiescent curre

文件：1.0201 Mbytes 页数：23 Pages

TI

德州仪器

丝印：CD4011BE；Package：PDIP；CMOS NAND GATES

Features: Propagation delay time = 60 ns (typ.) at CL =50 pF, Vpp = 10V = Buffered inputs and outputs = Standardized symmetrical output characteristics Maximum input current of 1 uA at 18 V over full package temperature range; 100 nA at 18 V and 25°C = 100% tested for quiescent curre

文件：1.0201 Mbytes 页数：23 Pages

TI

德州仪器

丝印：CD4011BE；Package：PDIP；CMOS NAND GATES

Features: Propagation delay time = 60 ns (typ.) at CL =50 pF, Vpp = 10V = Buffered inputs and outputs = Standardized symmetrical output characteristics Maximum input current of 1 uA at 18 V over full package temperature range; 100 nA at 18 V and 25°C = 100% tested for quiescent curre

文件：1.0201 Mbytes 页数：23 Pages

TI

德州仪器

丝印：CD4011BF；Package：CDIP；CMOS NAND GATES

Features: Propagation delay time = 60 ns (typ.) at CL =50 pF, Vpp = 10V = Buffered inputs and outputs = Standardized symmetrical output characteristics Maximum input current of 1 uA at 18 V over full package temperature range; 100 nA at 18 V and 25°C = 100% tested for quiescent curre

文件：1.0201 Mbytes 页数：23 Pages

TI

德州仪器

丝印：CD4011BF；Package：CDIP；CMOS NAND GATES

Features: Propagation delay time = 60 ns (typ.) at CL =50 pF, Vpp = 10V = Buffered inputs and outputs = Standardized symmetrical output characteristics Maximum input current of 1 uA at 18 V over full package temperature range; 100 nA at 18 V and 25°C = 100% tested for quiescent curre

文件：1.0201 Mbytes 页数：23 Pages

TI

德州仪器

丝印：CD4011BF3A；Package：CDIP；CMOS NAND GATES

Features: Propagation delay time = 60 ns (typ.) at CL =50 pF, Vpp = 10V = Buffered inputs and outputs = Standardized symmetrical output characteristics Maximum input current of 1 uA at 18 V over full package temperature range; 100 nA at 18 V and 25°C = 100% tested for quiescent curre

文件：1.0201 Mbytes 页数：23 Pages

TI

德州仪器

丝印：CD4011BF3A；Package：CDIP；CMOS NAND GATES

Features: Propagation delay time = 60 ns (typ.) at CL =50 pF, Vpp = 10V = Buffered inputs and outputs = Standardized symmetrical output characteristics Maximum input current of 1 uA at 18 V over full package temperature range; 100 nA at 18 V and 25°C = 100% tested for quiescent curre

文件：1.0201 Mbytes 页数：23 Pages

TI

德州仪器

丝印：CD4011BM；Package：SOIC；CMOS NAND GATES

Features: Propagation delay time = 60 ns (typ.) at CL =50 pF, Vpp = 10V = Buffered inputs and outputs = Standardized symmetrical output characteristics Maximum input current of 1 uA at 18 V over full package temperature range; 100 nA at 18 V and 25°C = 100% tested for quiescent curre

文件：1.0201 Mbytes 页数：23 Pages

TI

德州仪器