SN74BCT8374ADW.A芯片代码丝印对应型号-114ic电子网

型号	下载订购	功能描述	制造商上传企业	LOGO
SN74BCT8374ADW	文件：512.25 Kbytes Page：27 Pages	丝印：BCT8374A；Package：SOIC；SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS Members of the Texas Instruments SCOPE  Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F374 and ’BCT374 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio 文件：512.25 Kbytes 页数：27 Pages	TI 德州仪器	TI
SN74BCT8374ADW.A	文件：512.25 Kbytes Page：27 Pages	丝印：BCT8374A；Package：SOIC；SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS Members of the Texas Instruments SCOPE  Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F374 and ’BCT374 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio 文件：512.25 Kbytes 页数：27 Pages	TI 德州仪器	TI

更多BCT8374A供应商更新时间2025-9-14 15:14:00