丝印：BCT760MEP；Package：SOIC；OCTAL BUFFER/DRIVER WITH OPEN-COLLECTOR OUTPUTS

FEATURES · Controlled Baseline – One Assembly/Test Site, One Fabrication Site · Extended Temperature Performance of –55°C to 125°C · Enhanced Diminishing Manufacturing Sources (DMS) Support · Enhanced Product-Change Notification · Qualification Pedigree (1) · Open-Collector Version of 'B

文件：1.0171 Mbytes 页数：13 Pages

TI

德州仪器

丝印：BCT760MEP；Package：SOIC；OCTAL BUFFER/DRIVER WITH OPEN-COLLECTOR OUTPUTS

FEATURES · Controlled Baseline – One Assembly/Test Site, One Fabrication Site · Extended Temperature Performance of –55°C to 125°C · Enhanced Diminishing Manufacturing Sources (DMS) Support · Enhanced Product-Change Notification · Qualification Pedigree (1) · Open-Collector Version of 'B

文件：1.0171 Mbytes 页数：13 Pages

TI

德州仪器

丝印：BCT760MEP；Package：SOIC；OCTAL BUFFER/DRIVER WITH OPEN-COLLECTOR OUTPUTS

FEATURES · Controlled Baseline – One Assembly/Test Site, One Fabrication Site · Extended Temperature Performance of –55°C to 125°C · Enhanced Diminishing Manufacturing Sources (DMS) Support · Enhanced Product-Change Notification · Qualification Pedigree (1) · Open-Collector Version of 'B

文件：1.0171 Mbytes 页数：13 Pages

TI

德州仪器

丝印：BCT760MEP；Package：SOIC；OCTAL BUFFER/DRIVER WITH OPEN-COLLECTOR OUTPUTS

FEATURES · Controlled Baseline – One Assembly/Test Site, One Fabrication Site · Extended Temperature Performance of –55°C to 125°C · Enhanced Diminishing Manufacturing Sources (DMS) Support · Enhanced Product-Change Notification · Qualification Pedigree (1) · Open-Collector Version of 'B

文件：1.0171 Mbytes 页数：13 Pages

TI

德州仪器