丝印：AHC32EP；Package：TSSOP；QUADRUPLE 2-INPUT POSITIVE-OR GATE

Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† EPIC (Enhanced-Performance Implanted CMOS) Process

文件：211.44 Kbytes 页数：10 Pages

TI

德州仪器

丝印：AHC32EP；Package：TSSOP；QUADRUPLE 2-INPUT POSITIVE-OR GATE

Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† EPIC (Enhanced-Performance Implanted CMOS) Process

文件：211.44 Kbytes 页数：10 Pages

TI

德州仪器

丝印：AHC32EP；Package：TSSOP；QUADRUPLE 2-INPUT POSITIVE-OR GATE

Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† EPIC (Enhanced-Performance Implanted CMOS) Process

文件：211.44 Kbytes 页数：10 Pages

TI

德州仪器