SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

文件：433.54 Kbytes 页数：30 Pages

TI

德州仪器

WITH 18-BIT TRANSCEIVER AND REGISTER

文件：208.68 Kbytes 页数：13 Pages

TI

德州仪器

丝印：ABT18245A；Package：TSSOP；SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture SCOPE E Instruction Set – IEEE Standard 1149.1-1990 Required Instru

文件：1.38302 Mbytes 页数：38 Pages

TI

德州仪器

丝印：ABT18245A；Package：SSOP；SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture SCOPE E Instruction Set – IEEE Standard 1149.1-1990 Required Instru

文件：1.38302 Mbytes 页数：38 Pages

TI

德州仪器

丝印：ABT18245A；Package：SSOP；SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture SCOPE E Instruction Set – IEEE Standard 1149.1-1990 Required Instru

文件：1.38302 Mbytes 页数：38 Pages

TI

德州仪器

丝印：ABT18502；Package：LQFP；SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop

文件：698.03 Kbytes 页数：36 Pages

TI

德州仪器

丝印：ABT18502；Package：LQFP；SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop

文件：698.03 Kbytes 页数：36 Pages

TI

德州仪器

丝印：ABT18502；Package：LQFP；SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop

文件：698.03 Kbytes 页数：36 Pages

TI

德州仪器

丝印：ABT18502；Package：LQFP；SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop

文件：698.03 Kbytes 页数：36 Pages

TI

德州仪器

丝印：ABT18502；Package：LQFP；SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop

文件：698.03 Kbytes 页数：36 Pages

TI

德州仪器