丝印：5962-9318601MLA；Package：CDIP；SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F245 and ’ABT245 in the Normal-Function Mode SCOPE E Instruction Set: – IEEE Standard 114

文件：594.41 Kbytes 页数：32 Pages

TI

德州仪器

丝印：5962-9318601MLA；Package：CDIP；SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F245 and ’ABT245 in the Normal-Function Mode SCOPE E Instruction Set: – IEEE Standard 114

文件：594.41 Kbytes 页数：32 Pages

TI

德州仪器

丝印：5962-9318601MLA；Package：CDIP；SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F245 and ’ABT245 in the Normal-Function Mode SCOPE E Instruction Set: – IEEE Standard 114

文件：594.41 Kbytes 页数：32 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

文件：364.54 Kbytes 页数：25 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

文件：483.36 Kbytes 页数：28 Pages

TI

德州仪器