丝印：5962-9458601QXA；Package：CDIP；SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F646 and ’ABT646 in the Normal-Function Mode SCOPE Instruction Set − IEEE Standard 1149.1

文件：625.48 Kbytes 页数：34 Pages

TI

德州仪器

丝印：5962-9458601QXA；Package：CDIP；SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F646 and ’ABT646 in the Normal-Function Mode SCOPE Instruction Set − IEEE Standard 1149.1

文件：625.48 Kbytes 页数：34 Pages

TI

德州仪器

丝印：5962-9458601QXA；Package：CDIP；SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F646 and ’ABT646 in the Normal-Function Mode SCOPE Instruction Set − IEEE Standard 1149.1

文件：625.48 Kbytes 页数：34 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND RESISTERS

文件：537.39 Kbytes 页数：32 Pages

TI

德州仪器