丝印：5962-9172501M3A；Package：LCCC；SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

Members of the Texas Instruments SCOPE E Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F373 and BCT373 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation

文件：499.03 Kbytes 页数：27 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

文件：473.69 Kbytes 页数：26 Pages

TI

德州仪器

丝印：5962-9172501M3A；Package：LCCC；SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

Members of the Texas Instruments SCOPE E Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F373 and BCT373 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation

文件：499.03 Kbytes 页数：27 Pages

TI

德州仪器

丝印：5962-9172501M3A；Package：LCCC；SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

Members of the Texas Instruments SCOPE E Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F373 and BCT373 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation

文件：499.03 Kbytes 页数：27 Pages

TI

德州仪器