丝印：7H2140PWP；Package：HTSSOP；TPS7H2140-SEP Radiation-Tolerant 32-V, 160-mΩ Quad-Channel eFuse

1 Features • Vendor item drawing available, VID V62/23610 • Total ionizing dose (TID) characterized to 30 krad(Si) – RLAT (radiation lot acceptance testing) to 20 krad(Si) • Single-event effects (SEE) characterized – Single-event latch-up (SEL), single-event burnout (SEB), and single-event

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TI

德州仪器

UEM
SOT-23

UEM

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