丝印：TPS7H5002HFT；Package：CFP；TPS7H500x-SP Radiation-Hardness-Assured 2-MHz Current Mode PWM Controllers

1 Features • Radiation performance: – Radiation hardness assured (RHA) up to TID 100 krad(Si) – SEL, SEB, and SEGR immune to LET = 75 MeV-cm2/mg – SET and SEFI characterized up to LET = 75 MeV-cm2/mg – No cross-conduction events for controller outputs observed during SET characterization

文件：3.98562 Mbytes 页数：74 Pages

TI

德州仪器

丝印：TPS7H5002HFT；Package：CFP；TPS7H500x-SP Radiation-Hardness-Assured 2-MHz Current Mode PWM Controllers

1 Features • Radiation performance: – Radiation hardness assured (RHA) up to TID 100 krad(Si) – SEL, SEB, and SEGR immune to LET = 75 MeV-cm2/mg – SET and SEFI characterized up to LET = 75 MeV-cm2/mg – No cross-conduction events for controller outputs observed during SET characterization

文件：4.30599 Mbytes 页数：83 Pages

TI

德州仪器

丝印：TPS7H5002HFT；Package：CFP；TPS7H500x-SP Radiation-Hardness-Assured 2MHz Current Mode PWM Controllers

1 Features • Radiation performance: – Radiation hardness assured (RHA) up to TID 100krad(Si) – SEL, SEB, and SEGR immune to LET = 75MeV-cm2/mg – SET and SEFI characterized up to LET = 75MeV-cm2/mg – No cross-conduction events for controller outputs observed during SET characterization •

文件：4.37588 Mbytes 页数：84 Pages

TI

德州仪器

丝印：TPS7H5002HFT；Package：CFP；TPS7H500x-SP Radiation-Hardness-Assured 2MHz Current Mode PWM Controllers

1 Features • Radiation performance: – Radiation hardness assured (RHA) up to TID 100krad(Si) – SEL, SEB, and SEGR immune to LET = 75MeV-cm2/mg – SET and SEFI characterized up to LET = 75MeV-cm2/mg – No cross-conduction events for controller outputs observed during SET characterization •

文件：4.33994 Mbytes 页数：84 Pages

TI

德州仪器

丝印：TPS7H5002HFT；Package：CFP；TPS7H500x-SP Radiation-Hardness-Assured 2MHz Current Mode PWM Controllers

1 Features • Radiation performance: – Radiation hardness assured (RHA) up to TID 100krad(Si) – SEL, SEB, and SEGR immune to LET = 75MeV-cm2/mg – SET and SEFI characterized up to LET = 75MeV-cm2/mg – No cross-conduction events for controller outputs observed during SET characterization •

文件：4.33994 Mbytes 页数：84 Pages

TI

德州仪器

丝印：TPS7H5002HFT；Package：CFP；TPS7H500x-SP Radiation-Hardness-Assured 2-MHz Current Mode PWM Controllers

1 Features • Radiation performance: – Radiation hardness assured (RHA) up to TID 100 krad(Si) – SEL, SEB, and SEGR immune to LET = 75 MeV-cm2/mg – SET and SEFI characterized up to LET = 75 MeV-cm2/mg – No cross-conduction events for controller outputs observed during SET characterization

文件：3.98562 Mbytes 页数：74 Pages

TI

德州仪器

丝印：TPS7H5002HFT；Package：CFP；TPS7H500x-SP Radiation-Hardness-Assured 2-MHz Current Mode PWM Controllers

1 Features • Radiation performance: – Radiation hardness assured (RHA) up to TID 100 krad(Si) – SEL, SEB, and SEGR immune to LET = 75 MeV-cm2/mg – SET and SEFI characterized up to LET = 75 MeV-cm2/mg – No cross-conduction events for controller outputs observed during SET characterization

文件：4.30599 Mbytes 页数：83 Pages

TI

德州仪器

丝印：TPS7H5002HFT；Package：CFP；TPS7H500x-SP Radiation-Hardness-Assured 2MHz Current Mode PWM Controllers

1 Features • Radiation performance: – Radiation hardness assured (RHA) up to TID 100krad(Si) – SEL, SEB, and SEGR immune to LET = 75MeV-cm2/mg – SET and SEFI characterized up to LET = 75MeV-cm2/mg – No cross-conduction events for controller outputs observed during SET characterization •

文件：4.37588 Mbytes 页数：84 Pages

TI

德州仪器

丝印：TPS7H5002HFT；Package：CFP；TPS7H500x-SP Radiation-Hardness-Assured 2-MHz Current Mode PWM Controllers

1 Features • Radiation performance: – Radiation hardness assured (RHA) up to TID 100 krad(Si) – SEL, SEB, and SEGR immune to LET = 75 MeV-cm2/mg – SET and SEFI characterized up to LET = 75 MeV-cm2/mg – No cross-conduction events for controller outputs observed during SET characterization

文件：3.98562 Mbytes 页数：74 Pages

TI

德州仪器

丝印：TPS7H5002HFT；Package：CFP；TPS7H500x-SP Radiation-Hardness-Assured 2-MHz Current Mode PWM Controllers

1 Features • Radiation performance: – Radiation hardness assured (RHA) up to TID 100 krad(Si) – SEL, SEB, and SEGR immune to LET = 75 MeV-cm2/mg – SET and SEFI characterized up to LET = 75 MeV-cm2/mg – No cross-conduction events for controller outputs observed during SET characterization

文件：4.30599 Mbytes 页数：83 Pages

TI

德州仪器