TLE2024-EP中文资料增强型产品 Excalibur 高速、低功耗、精密运算放大器数据手册TI规格书

描述 Description

The TLE202x and TLE202xA devices are precision, high-speed, low-power operational amplifiers using a new Texas Instruments Excalibur process. These devices combine the best features of the OP21 with highly improved slew rate and unity-gain bandwidth.
The complementary bipolar Excalibur process utilizes isolated vertical pnp transistors that yield dramatic improvement in unity-gain bandwidth and slew rate over similar devices.
The addition of a bias circuit in conjunction with this process results in extremely stable parameters with both time and temperature. This means that a precision device remains a precision device even with changes in temperature and over years of use.
This combination of excellent dc performance with a common-mode input voltage range that includes the negative rail makes these devices the ideal choice for low-level signal conditioning applications in either single-supply or split-supply configurations. In addition, these devices offer phase-reversal protection circuitry that eliminates an unexpected change in output states when one of the inputs goes below the negative supply rail.
A variety of options are available in small-outline packaging for high-density systems applications.
The Q-suffix devices are characterized for operation over the full automotive temperature range of –40°C to 125°C.

特性 Features

• Controlled Baseline
• Extended Temperature Performance of –40°C to 125°C
• Enhanced Diminishing Manufacturing Sources (DMS) Support
• Qualification Pedigree
• High Unity-Gain Bandwidth . . . 2 MHz Typ
• Supply-Current Change Over Full Temp Range . . . 10 µA Typ at VCC± = ±15 V
• Phase-Reversal Protection
• Low Offset Voltage . . . 100 µV Max
• Low Input Bias Current . . . 50 nA Max
• Low Noise Voltage . . . 19 nV/Hz Typ
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.