丝印：5962-9172701QLA；Package：CDIP；SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

Members of the Texas Instruments SCOPE  Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F374 and ’BCT374 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio

文件：512.25 Kbytes 页数：27 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件：474.07 Kbytes 页数：26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件：474.07 Kbytes 页数：26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件：474.07 Kbytes 页数：26 Pages

TI

德州仪器