丝印：LVTH18646A；Package：LQFP；3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) Support Unregulated Battery Operation Down to 2.7 V

文件：826.23 Kbytes 页数：42 Pages

TI

德州仪器

3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS

文件：551.16 Kbytes 页数：36 Pages

TI

德州仪器

3.3-V ABT SCAN TEST DEVICES

文件：605.82 Kbytes 页数：38 Pages

TI

德州仪器

丝印：LVTH18646A；Package：LQFP；3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) Support Unregulated Battery Operation Down to 2.7 V

文件：826.23 Kbytes 页数：42 Pages

TI

德州仪器

丝印：LVTH18646A；Package：LQFP；3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) Support Unregulated Battery Operation Down to 2.7 V

文件：826.23 Kbytes 页数：42 Pages

TI

德州仪器

3.3-V ABT SCAN TEST DEVICES

文件：605.82 Kbytes 页数：38 Pages

TI

德州仪器

Package：64-LQFP；包装：卷带（TR）剪切带（CT）Digi-Reel® 得捷定制卷带 类别：集成电路（IC） 专用逻辑器件 描述：IC SCAN-TEST-DEV/XCVR 64-LQFP

TI

德州仪器