3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments (TIE) SCOPE E Family of Testability Products
Members of the TI WidebusE Family
State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC)
Support Unregulated Battery Operation Down to 2.7 V

文件：643.29 Kbytes 页数：37 Pages

TI

德州仪器

3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

文件：548.92 Kbytes 页数：34 Pages

TI

德州仪器

3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

文件：584.68 Kbytes 页数：38 Pages

TI

德州仪器

具有 20 位通用总线收发器的 3.3V ABT 扫描测试设备

The 'LVTH18514 and 'LVTH182514 scan test devices with 20-bit universal bus transceivers are members of the TI SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the • Members of the Texas Instruments (TITM)SCOPETM Family of Testability Products• Members of the TIWidebusTM Family• State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC)• Support Unregulated Battery Operation Down to 2.7 V• UBTTM (Unive;

TI

德州仪器

丝印：LVTH18514；Package：TSSOP；3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments (TIE) SCOPE E Family of Testability Products Members of the TI WidebusE Family State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) Support Unregulated Battery Operation Down to 2.7 V UBT E (U

文件：642.76 Kbytes 页数：37 Pages

TI

德州仪器

丝印：LVTH18514；Package：TSSOP；3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments (TIE) SCOPE E Family of Testability Products
Members of the TI WidebusE Family
State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC)
Support Unregulated Battery Operation Down to 2.7 V

文件：643.29 Kbytes 页数：37 Pages

TI

德州仪器

丝印：LVTH18514；Package：TSSOP；3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments (TIE) SCOPE E Family of Testability Products
Members of the TI WidebusE Family
State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC)
Support Unregulated Battery Operation Down to 2.7 V

文件：643.29 Kbytes 页数：37 Pages

TI

德州仪器

3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

文件：548.92 Kbytes 页数：34 Pages

TI

德州仪器

3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

文件：584.68 Kbytes 页数：38 Pages

TI

德州仪器

Package：64-TFSOP（0.240"，6.10mm 宽）；包装：管件 类别：集成电路（IC） 通用总线功能 描述：IC SCAN TEST UNIV TXRX 64TSSOP

TI

德州仪器