SN74LVC16244A-EP数据手册TI中文资料规格书

描述 Description

This 16-bit buffer/driver is designed for 1.65-V to 3.6-V VCC operation.

The SN74LVC16244A is designed specifically to improve the performance and density of 3-state memory address drivers, clock drivers, and bus-oriented receivers and transmitters.

The device can be used as four 4-bit buffers, two 8-bit buffers, or one 16-bit buffer. It provides true outputs and symmetrical active-low output-enable (OE)\\ inputs.

Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of this device as a translator in a mixed 3.3-V/5-V system environment.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

To ensure the high-impedance state during power up or power down, OE\\ should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

特性 Features

• Controlled Baseline
• One Assembly/Test Site, One Fabrication Site

• Enhanced Diminishing Manufacturing Sources (DMS) Support
• Enhanced Product-Change Notification
• Qualification Pedigree
• Member of the Texas Instruments Widebus™ Family
• Operates From 1.65 V to 3.6 V
• Inputs Accept Voltages to 5.5 V
• Max tpd of 4.1 ns at 3.3 V
• Typical VOLP (Output Ground Bounce)    CC = 3.3 V, TA = 25°C
• Typical VOHV (Output VOH Undershoot)    >2 V at VCC = 3.3 V, TA = 25°C
• Ioff Supports Partial-Power-Down Mode Operation
• Supports Mixed-Mode Signal Operation On All Ports (5-V Input/Output Voltage With 3.3-V VCC)
• Latch-Up Performance Exceeds 250 mA Per JESD 17
• ESD Protection Exceeds JESD 22
• 2000-V Human-Body Model (A114-A)
• 1000-V Charged-Device Model (C101)

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. Widebus is a trademark of Texas Instruments.