16-BIT D-TYPE EDGE-TRIGGERED FLIP-FLOP WITH 3-STATE OUTPUTS

Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –40°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product Change Notification Qualification Pedigree† Member of the Texas Instruments Widebus Family Inpu

文件：536.44 Kbytes 页数：10 Pages

TI

德州仪器

丝印：ACT16374QEP；Package：SSOP；16-BIT D-TYPE EDGE-TRIGGERED FLIP-FLOP WITH 3-STATE OUTPUTS

Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –40°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product Change Notification Qualification Pedigree† Member of the Texas Instruments Widebus Family Inpu

文件：536.44 Kbytes 页数：10 Pages

TI

德州仪器

丝印：ACT16374QEP；Package：SSOP；16-BIT D-TYPE EDGE-TRIGGERED FLIP-FLOP WITH 3-STATE OUTPUTS

Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –40°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product Change Notification Qualification Pedigree† Member of the Texas Instruments Widebus Family Inpu

文件：536.44 Kbytes 页数：10 Pages

TI

德州仪器

丝印：ACT164Q；Package：TSSOP；SN74ACT164-Q1 8-Bit Serial-In/Parallel-Out Shift Register

1 Features • AEC-Q100 qualified for automotive applications: – Device temperature grade 1: -40°C to +125°C – Device HBM ESD classification level 2 – Device CDM ESD classification level C4B • Available in wettable flank QFN package • Operating voltage range of 4.5V to 5.5V • TTL-compatible i

文件：1.62837 Mbytes 页数：29 Pages

TI

德州仪器

SN74ACT164-Q1 8-Bit Serial-In/Parallel-Out Shift Register

1 Features • AEC-Q100 qualified for automotive applications: – Device temperature grade 1: -40°C to +125°C – Device HBM ESD classification level 2 – Device CDM ESD classification level C4B • Available in wettable flank QFN package • Operating voltage range of 4.5V to 5.5V • TTL-compatible i

文件：1.62837 Mbytes 页数：29 Pages

TI

德州仪器

SN74ACT164-Q1 Automotive Hex D-Type Flip-Flops with Clear

1 Features • AEC-Q100 qualified for automotive applications: – Device temperature grade 1: -40°C to +125°C – Device HBM ESD classification level 2 – Device CDM ESD classification level C4B • Available in wettable flank QFN package • Wide operating range of 1.5V to 6V • Inputs accept voltage

文件：1.89301 Mbytes 页数：32 Pages

TI

德州仪器

SN74ACT164-Q1 Automotive Hex D-Type Flip-Flops with Clear

1 Features • AEC-Q100 qualified for automotive applications: – Device temperature grade 1: -40°C to +125°C – Device HBM ESD classification level 2 – Device CDM ESD classification level C4B • Available in wettable flank QFN package • Operating voltage range of 4.5V to 5.5V • Continuous ±24mA

文件：1.84824 Mbytes 页数：27 Pages

TI

德州仪器

丝印：AD164Q；Package：WQFN；SN74ACT164-Q1 8-Bit Serial-In/Parallel-Out Shift Register

1 Features • AEC-Q100 qualified for automotive applications: – Device temperature grade 1: -40°C to +125°C – Device HBM ESD classification level 2 – Device CDM ESD classification level C4B • Available in wettable flank QFN package • Operating voltage range of 4.5V to 5.5V • TTL-compatible i

文件：1.62837 Mbytes 页数：29 Pages

TI

德州仪器

SN74ACT165 8-Bit Parallel-Load Shift Registers with TTL-Compatible Inputs

1 Features • Operating voltage range of 4.5V to 5.5V • TTL-compatible inputs • Continuous ±24mA output drive at 5V • Supports up to ±75mA output drive at 5V in short bursts • Drives 50Ω transmission lines • Fast operation with delay of 12.4ns max at 5V 2 Applications • Increase the numb

文件：744.25 Kbytes 页数：20 Pages

TI

德州仪器

SN74ACT165-Q1 Automotive 8-Bit Parallel-Load Shift Registers with TTL-Compatible Inputs

1 Features • AEC-Q100 qualified for automotive applications: – Device temperature grade 1: -40°C to +125°C – Device HBM ESD classification level 2 – Device CDM ESD classification level C4B • Available in wettable flank QFN package • Operating voltage range of 4.5V to 5.5V • TTL-compatible i

文件：1.86644 Mbytes 页数：32 Pages

TI

德州仪器