Package：28-BSSOP（0.295"，7.50mm 宽）；包装：管件 类别：集成电路（IC） 专用逻辑器件 描述：IC SCAN TEST DEVICE 28-SSOP

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F543 and ABT543 in the Normal-Function Mode SCOPE E Instruction Set – IEEE Standard 1149.

文件：566.93 Kbytes 页数：31 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS

文件：537.93 Kbytes 页数：31 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS

文件：357.14 Kbytes 页数：25 Pages

TI

德州仪器