SN74ABT8543DW集成电路（IC）的专用逻辑器件规格书PDF中文资料

SN74ABT8543DW属于集成电路（IC）的专用逻辑器件。由德州仪器制造生产的SN74ABT8543DW专用逻辑器件专用逻辑 IC 设计提供应用特定的逻辑输出类型，例如 BCD 速率倍增、可寻址扫描端口、总线终端阵列、CML 驱动器、比较器、ABT 扫描测试、二进制全加法器、互补对加逆变器、可配置缓冲器、触点颤动消除器、晶体振荡器、延迟元件、差分接收器、LVTTL 到 GTLP 收发器、存储器解码器、电源良好检测器和分频器。

Members of the Texas Instruments

SCOPE E Family of Testability Products

Compatible With the IEEE Standard

1149.1-1990 (JTAG) Test Access Port and

Boundary-Scan Architecture

Functionally Equivalent to ’F543 and

ABT543 in the Normal-Function Mode

SCOPE E Instruction Set

– IEEE Standard 1149.1-1990 Required

Instructions, Optional INTEST, CLAMP,

and HIGHZ

– Parallel-Signature Analysis at Inputs

With Masking Option

– Pseudo-Random Pattern Generation

From Outputs

– Sample Inputs/Toggle Outputs

– Binary Count From Outputs

– Even-Parity Opcodes

Two Boundary-Scan Cells Per I/O for

Greater Flexibility

State-of-the-Art EPIC-IIBE BiCMOS Design

Significantly Reduces Power Dissipation

Package Options Include Plastic

Small-Outline (DW) and Shrink

Small-Outline (DL) Packages, Ceramic Chip

Carriers (FK), and Standard Ceramic

DIPs (JT)

description

The ’ABT8543 scan test devices with octal

registered bus transceivers are members of the

Texas Instruments SCOPEE testability

integrated-circuit family. This family of devices

supports IEEE Standard 1149.1-1990 boundary

scan to facilitate testing of complex circuit-board

assemblies. Scan access to the test circuitry is

accomplished via the 4-wire test access port

(TAP) interface.

In the normal mode, these devices are functionally equivalent to the ’F543 and ’ABT543 octal registered bus

transceivers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at

the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in normal mode does not

affect the functional operation of the SCOPEE octal registered bus transceivers.