SN74ABT244A-EP中文资料具有 TTL 兼容型 CMOS 输入和三态输出的增强型产品 8 通道、4.5V 至 5.5V 缓冲器数据手册TI规格书

描述 Description

This octal buffer and line driver is designed specifically to improve both the performance and density of 3-state memory address drivers, clock drivers, and bus-oriented receivers and transmitters. Together with the SN54ABT240, SN74ABT240A, SN54ABT241, and SN74ABT241A, these devices provide the choice of selected combinations of inverting and noninverting outputs, symmetrical active-low output-enable (OE) inputs, and complementary OE and OE inputs. The SN74ABT244A is organized as two 4-bit buffers/line drivers with separate OE inputs. When OE is low, the device passes noninverted data from the A inputs to the Y outputs. When OE is high, the outputs are in the high-impedance state. To ensure the high-impedance state during power up or power down, OE should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver. The SN74ABT244 is characterized for operation over the full military temperature range of -55°C to 125°C.

特性 Features

• Controlled Baseline
• Extended Temperature Performance of -55°C to 125°C
• Enhanced Product-Change Notification
• State-of-the-Art EPIC-IIB™ BiCMOS Design Significantly Reduces Power Dissipation
• ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0)
• High-Drive Outputs (-24-mA IOH, 48-mA IOL)
• Packaged in Shrink Small-Outline (DB) Package

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. EPIC-IIB is a trademark of Texas Intruments.