丝印：ABT18646；Package：LQFP；SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER

Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for

文件：437.67 Kbytes 页数：16 Pages

TI

德州仪器

SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER

Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for

文件：437.67 Kbytes 页数：16 Pages

TI

德州仪器

WITH 18-BIT TRANSCEIVER AND REGISTER

文件：208.68 Kbytes 页数：13 Pages

TI

德州仪器

SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER

Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for

文件：437.67 Kbytes 页数：16 Pages

TI

德州仪器