丝印：ABT18640；Package：SSOP；SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture SCOPE E Instruction Set – IEEE Standard 1149.1-1990 Required Instru

文件：512.64 Kbytes 页数：30 Pages

TI

德州仪器

SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS

文件：400.7 Kbytes 页数：30 Pages

TI

德州仪器

丝印：ABT18640；Package：SSOP；SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture SCOPE E Instruction Set – IEEE Standard 1149.1-1990 Required Instru

文件：512.64 Kbytes 页数：30 Pages

TI

德州仪器

Package：56-BSSOP（0.295"，7.50mm 宽）；包装：卷带（TR）剪切带（CT）Digi-Reel® 得捷定制卷带 类别：集成电路（IC） 专用逻辑器件 描述：IC SCAN-TEST-DEV/TXRX 56-SSOP

TI

德州仪器

Package：56-BSSOP（0.295"，7.50mm 宽）；包装：管件 类别：集成电路（IC） 专用逻辑器件 描述：IC SCAN TEST DEVICE 18BIT 56SSOP

TI

德州仪器

Package：56-BSSOP（0.295"，7.50mm 宽）；包装：管件 类别：集成电路（IC） 专用逻辑器件 描述：IC SCAN TEST DEVICE 18BIT 56SSOP

TI

德州仪器