SN54SC8T165-SEP中文资料德州仪器数据手册PDF规格书

1 Features

• Vendor item drawing available, VID

V62/25625-01XE

• Radiation - Total Ionizing Dose (TID):

– TID characterized up to 50krad(Si)

– TID performance assurance up to 30krad(Si)

– Radiation Lot Acceptance Testing (RLAT) for

every wafer lot up to 30krad(Si)

• Radiation - Single-Event Effects (SEE):

– Single Event Latch-Up (SEL) immune up to

50MeV-cm2/mg at 125°C

– Single Event Transient (SET) characterized up

to LET = 50MeV-cm2/mg

• Wide operating range of 1.2V to 5.5V

• Single-supply voltage translator:

– Up translation:

• 1.2V to 1.8V

• 1.5V to 2.5V

• 1.8V to 3.3V

• 3.3V to 5.0V

– Down translation:

• 5.0V, 3.3V, 2.5V to 1.8V

• 5.0V, 3.3V to 2.5V

• 5.0V to 3.3V

• 5.5V tolerant input pins

• Supports standard pinouts

• Up to 150Mbps with 5V or 3.3V VCC

• Latch-up performance exceeds 250mA per JESD

17

• Space enhanced plastic:

– Supports defense and aerospace applications

– Controlled baseline

– Au bondwire and NiPdAu lead finish

– Meets NASA ASTM E595 outgassing

specification

– One fabrication, assembly, and test site

– Extended product life cycle

– Product traceability

2 Applications

• Enable or disable a digital signal

• Controlling an indicator LED

• Translation between communication modules and

system controllers

3 Description

The SN54SC8T165-SEP device is a parallel- or

serial-in, serial-out 8-bit shift register. This device has

two modes of operation: load data, and shift data

which are controlled by the SH/LD input. The output

level is referenced to the supply voltage (VCC) and

supports 1.8V, 2.5V, 3.3V, and 5V CMOS levels.

The input is designed with a lower threshold circuit to

support up translation for lower voltage CMOS inputs

(for example 1.2V input to 1.8V output or 1.8V input

to 3.3V output). In addition, the 5V tolerant input pins

enable down translation (for example 3.3V to 2.5V

output).

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