SN54SC8T138-SEP中文资料德州仪器数据手册PDF规格书

1 Features

• VID TBD

• Radiation Tolerant:

– Single Event Latch-Up (SEL) immune up to

43MeV-cm2/mg at 125°C

– Total Ionizing Does (TID) Radiation Lot

Acceptance Testing (RLAT) for every wafer lot

up to 30 krad(Si)

– Single Event Transient (SET) characterized up

to LET = 43MeV-cm2/mg

• Wide operating range of 1.2 V to 5.5 V

• Single-supply voltage translator:

– Up translation:

• 1.2 V to 1.8 V

• 1.5 V to 2.5 V

• 1.8 V to 3.3 V

• 3.3 V to 5.0V

– Down translation:

• 5.0V, 3.3 V, 2.5 V to 1.8 V

• 5.0V, 3.3 V to 2.5 V

• 5.0V to 3.3 V

• 5.5-V tolerant input pins

• Supports standard pinouts

• Up to 150Mbps with 5-V or 3.3-V VCC

• Latch-up performance exceeds 250mA per JESD

17

• Space Enhanced Plastic:

– Controlled baseline

– Au bondwire and NiPdAu lead finish

– Meets NASA ASTM E595 outgassing

specification

– One fabrication, assembly, and test site

– Extended product life cycle

– Product traceability

2 Applications

• Enable or disable a digital signal

• Controlling an indicator LED

• Translation between communication modules and

system controllers

3 Description

The SN54SC8T138-SEP is a three to eight decoder

with one standard output strobe (G2) and two active

low output strobes (G 1 and G 0). When the outputs

are gated by any of the strobe inputs, they are all

forced into the high state. When the outputs are not

disabled by the strobe inputs, only the selected output

is low while all others are high. The output level is

referenced to the supply voltage (VCC) and supports

1.8-V, 2.5-V, 3.3-V, and 5-V CMOS levels.

The input is designed with a lower threshold circuit to

support up translation for lower voltage CMOS inputs

(for example, 1.2 V input to 1.8 V output or 1.8 V input

to 3.3 V output). In addition, the 5-V tolerant input pins

enable down translation (for example, 3.3 V to 2.5 V

output).