TRIPLE 3-INPUT POSITIVE-NAND GATE

Controlled Baseline − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −40°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† Wide Operating Voltage Range of 2 V to 6 V Outputs C

文件：511.35 Kbytes 页数：15 Pages

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德州仪器

SN74HC10-Q1 Automotive Triple 3-Input NAND Gates

1 Features 1• AEC-Q100 Qualified for automotive applications: – Device temperature grade 1: –40°C to +125°C, TA • Buffered inputs • Positive and negative input clamp diodes • Wide operating voltage range: 2 V to 6 V • Supports fanout up to 10 LSTTL loads • Significant power reduction compa

文件：442.98 Kbytes 页数：20 Pages

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德州仪器

TRIPLE 3-INPUT POSITIVE-NAND GATES

文件：76.9 Kbytes 页数：5 Pages

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德州仪器

TRIPLE 3-INPUT POSITIVE-NAND GATES

文件：664.89 Kbytes 页数：17 Pages

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德州仪器

TRIPLE 3-INPUT POSITIVE-NAND GATES

文件：1.09918 Mbytes 页数：20 Pages

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德州仪器

军用 3 通道、3 输入、2V 至 6V 与非门

This device contains three independent 3-input NAND gates. Each gate performs the Boolean function Y =  A ● B ● C in positive logic. • Buffered inputs\n• Wide operating voltage range: 2 V to 6 V\n• Wide operating temperature range: –40°C to +85°C\n• Supports fanout up to 10 LSTTL loads\n• Significant power reduction compared to LSTTL logic ICs;

TI

德州仪器

TRIPLE 3-INPUT POSITIVE-NAND GATES

文件：664.89 Kbytes 页数：17 Pages

TI

德州仪器

TRIPLE 3-INPUT POSITIVE-NAND GATES

文件：1.09918 Mbytes 页数：20 Pages

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德州仪器

DUAL J-K POSITIVE-EDGE-TRIGGERED FLIP-FLOPS WITH CLEAR AND PRESET

文件：827.56 Kbytes 页数：19 Pages

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德州仪器

DUAL J-K POSITIVE-EDGE-TRIGGERED FLIP-FLOPS WITH CLEAR AND PRESET

文件：142.19 Kbytes 页数：5 Pages

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德州仪器