SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

Members of the Texas Instruments SCOPE E Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F373 and BCT373 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation

文件：499.03 Kbytes 页数：27 Pages

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德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

文件：473.69 Kbytes 页数：26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

文件：473.69 Kbytes 页数：26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

文件：473.69 Kbytes 页数：26 Pages

TI

德州仪器

具有八路 D 类锁存器的扫描测试设备

The 'BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test cir • Members of the Texas Instruments SCOPETM Family ofTestability Products• Octal Test-Integrated Circuits• Functionally Equivalent to 'F373 and 'BCT373 in theNormal-Function Mode• Compatible With the IEEE Standard 1149.1-1990 (JTAG) TestAccess Port and Boundary-Scan Architecture• Test Operation Synch;

TI

德州仪器