SN54BCT8373AJT规格书供应商报价德州仪器TI-114ic电子网

型号	下载订购	功能描述	制造商上传企业	LOGO
SN54BCT8373AJT	文件：473.69 Kbytes Page：26 Pages	SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES 文件：473.69 Kbytes 页数：26 Pages	TI 德州仪器	TI
SNJ54BCT8373AFK	文件：499.03 Kbytes Page：27 Pages	SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES Members of the Texas Instruments SCOPE E Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F373 and BCT373 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation 文件：499.03 Kbytes 页数：27 Pages	TI 德州仪器	TI
SNJ54BCT8373AFK	文件：473.69 Kbytes Page：26 Pages	SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES 文件：473.69 Kbytes 页数：26 Pages	TI 德州仪器	TI
SNJ54BCT8373AFK.A	文件：499.03 Kbytes Page：27 Pages	SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES Members of the Texas Instruments SCOPE E Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F373 and BCT373 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation 文件：499.03 Kbytes 页数：27 Pages	TI 德州仪器	TI

更多SN54BCT8373AJT供应商更新时间2025-10-11 15:01:00