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SN54ACT8997中文资料具有 TTL 兼容型 CMOS 输入和三态输出的军用 4 通道 4.5V 至 5.5V 反相器数据手册TI规格书

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厂商型号

SN54ACT8997

功能描述

具有 TTL 兼容型 CMOS 输入和三态输出的军用 4 通道 4.5V 至 5.5V 反相器

制造商

TI Texas Instruments

中文名称

德州仪器 美国德州仪器公司

数据手册

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更新时间

2025-9-26 22:59:00

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SN54ACT8997规格书详情

描述 Description

The 'ACT8997 are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of components facilitates testing of complex circuit-board assemblies.The 'ACT8997 enhance the scan capability of TI's SCOPETM family by allowing augmentation of a system's primary scan path with secondary scan paths (SSPs), which can be individually selected by the 'ACT8997 for inclusion in the primary scan path. These devices also provide buffering of test signals to reduce the need for external logic.By loading the proper values into the instruction register and data registers, the user can select up to four SSPs to be included in a primary scan path. Any combination of the SSPs can be selected at a time. Any of the device's six data registers or the instruction register can be placed in the device's scan path, i.e., placed between test data input (TDI) and test data output (TDO) for subsequent shift and scan operations.All operations of the device except counting are synchronous to the test clock pin (TCK). The 8-bit programmable up/down counter can be used to count transitions on the device condition input (DCI) pin and output interrupt signals via the device condition output (DCO) pin. The device can be configured to count on either the rising or falling edge of DCI.The test access port (TAP) controller is a finite-state machine compatible with IEEE Standard 1149.1.The SN54ACT8997 is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ACT8997 is characterized for operation from 0°C to 70°C.

特性 Features

• Members of the Texas Instruments SCOPETM Family of Testability Products
• Allow Partitioning of System Scan Paths
• Select Up to Four Secondary Scan Paths to Be Included in a Primary Scan Path
• Include 4-Bit Identification Bus for Scan-Path Identification
• EPICTM (Enhanced-Performance Implanted CMOS) 1-m Process
• Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic (NT) and Ceramic (JT) 300-mil DIPs
  SCOPE and EPIC are trademarks of Texas Instruments Incorporated.

技术参数

  • 制造商编号

    :SN54ACT8997

  • 生产厂家

    :TI

  • Supply voltage (Min) (V)

    :4.5

  • Supply voltage (Max) (V)

    :5.5

  • Number of channels (#)

    :4

  • IOL (Max) (mA)

    :48

  • IOH (Max) (mA)

    :-16

  • ICC (Max) (uA)

    :100

  • Input type

    :TTL-Compatible CMOS

  • Output type

    :3-State

  • Features

    :High speed (tpd 10-50ns)

  • Rating

    :Military

供应商 型号 品牌 批号 封装 库存 备注 价格
TI/德州仪器
24+
NA/
3404
原厂直销,现货供应,账期支持!
询价
DIP14
23+
NA
15659
振宏微专业只做正品,假一罚百!
询价
TI/德州仪器
2450+
TSSOP16
6540
只做原装正品现货!或订货假一赔十!
询价
TI/德州仪器
QQ咨询
CDIP
827
全新原装 研究所指定供货商
询价
TI
23+
CDIP-20
5000
原装正品,假一罚十
询价
最新
2000
原装正品现货
询价
TI/德州仪器
23+
CDIPLCCC
11200
原厂授权一级代理、全球订货优势渠道、可提供一站式BO
询价
TI/德州仪器
23+
TSSOP16
50000
全新原装正品现货,支持订货
询价
ADI
23+
TSSOP16
8000
只做原装现货
询价
TI德州仪器
22+
24000
原装正品现货,实单可谈,量大价优
询价