ADAPTADOR DE PROGRAMADOR M64 ADP EN ENCAPSULADO TQFP64

Descripción Yamaichi IC Test & Burn-in Socket con una placa simple, especialmente para MCU AVR en paquete TQFP64

文件：410.66 Kbytes 页数：2 Pages

AGELECTRONICA

TPS3762 Wide VIN 65 V Dual Channel Overvoltage & Undervoltage (OV & UV) Detector with Built-In Self-Test

1 Features • SIL-3 Functional Safety-compliant product targeted – Development targeted for Functional Safety applications – Documentation to aid IEC 61508 system design – Systematic capability up to SIL-3 targeted – Hardware capability up to SIL-3 targeted • Monitor high voltage power rails

文件：2.097139 Mbytes 页数：39 Pages

TI

德州仪器

TPS3762 65 V Window (OV & UV) Supervisor with Built-In Self-Test and Latch

1 Features • SIL-3 Functional Safety-compliant product targeted – Documentation to aid IEC 61508 system design – Systematic capability up to SIL-3 targeted – Hardware capability up to SIL-3 targeted • Device flexibility to meet design requirements – Wide voltage threshold range: 2.7 V to 60

文件：2.19741 Mbytes 页数：42 Pages

TI

德州仪器

TPS3762-Q1 Automotive 65V Window (OV & UV) Supervisor with Built-In Self-Test and Latch

1 Features • ASIL-D Functional Safety-Compliant – Documentation to aid ISO 26262 system design – Systematic capability up to ASIL-D – Hardware capability up to ASIL-D • AEC-Q100 qualified for automotive applications – Device temperature grade 1: –40°C to +125°C • Device flexibility to meet

文件：2.29306 Mbytes 页数：46 Pages

TI

德州仪器