TPS3762 Wide VIN 65 V Dual Channel Overvoltage & Undervoltage (OV & UV) Detector with Built-In Self-Test

1 Features • SIL-3 Functional Safety-compliant product targeted – Development targeted for Functional Safety applications – Documentation to aid IEC 61508 system design – Systematic capability up to SIL-3 targeted – Hardware capability up to SIL-3 targeted • Monitor high voltage power rails

文件：2.097139 Mbytes 页数：39 Pages

TI

德州仪器

TPS3762 65 V Window (OV & UV) Supervisor with Built-In Self-Test and Latch

1 Features • SIL-3 Functional Safety-compliant product targeted – Documentation to aid IEC 61508 system design – Systematic capability up to SIL-3 targeted – Hardware capability up to SIL-3 targeted • Device flexibility to meet design requirements – Wide voltage threshold range: 2.7 V to 60

文件：2.19741 Mbytes 页数：42 Pages

TI

德州仪器

TPS3762-Q1 Automotive 65V Window (OV & UV) Supervisor with Built-In Self-Test and Latch

1 Features • ASIL-D Functional Safety-Compliant – Documentation to aid ISO 26262 system design – Systematic capability up to ASIL-D – Hardware capability up to ASIL-D • AEC-Q100 qualified for automotive applications – Device temperature grade 1: –40°C to +125°C • Device flexibility to meet

文件：2.29306 Mbytes 页数：46 Pages

TI

德州仪器

具有内置自检功能的 65V 窗口监控器

TPS3762 是一款具有 4µA IDD、0.9% 精度、快速检测时间和内置自检功能的 65V 输入电压监控器。该器件可直接连接到 12V/24V 工业 SELV 电源轨，用于持续监测过压 (OV) 和欠压 (UV) 条件；由于使用内部电阻分压器，TPS3762 的总体解决方案尺寸非常小。提供了宽迟滞电压选项，从而可以忽略大电压瞬态。SENSE 引脚上的内置迟滞特性有助于在监测电源电压轨时防止出现错误的复位信号。\n\n通过单独的 VDD 和 SENSE 引脚，可实现高可靠性系统所需的冗余，并且 SENSE 引脚可以监控比 VDD 更高和更低的电压。SENSE 引脚的高阻抗输入支持使 符合 SIL-3 等级功能安全标准的产品 \n \n可提供用于 IEC 61508 系统设计的文档\n \n以系统能力达到 SIL-3 级为目标\n \n以硬件功能达到 SIL-3 级为目标\n \n\n \n器件灵活性可满足设计要求 \n \n宽电压阈值范围：2.7 V 至 60 V\n \n800mV 选项 - 与外部电阻分压器配合使用来设置阈值\n \n内置迟滞（2%、5% 和 10% 选项）\n \n固定和可编程复位延时时间\n \n固定和可编程检测延迟\n \n\n \n监测高压电源轨 \n \n宽输入电压范围：2.7V 至 65V\n \n在检测引脚上提供 ;

TI

德州仪器

TPS3762 65 V Window (OV & UV) Supervisor with Built-In Self-Test and Latch

1 Features • SIL-3 Functional Safety-compliant product targeted – Documentation to aid IEC 61508 system design – Systematic capability up to SIL-3 targeted – Hardware capability up to SIL-3 targeted • Device flexibility to meet design requirements – Wide voltage threshold range: 2.7 V to 60

文件：2.19741 Mbytes 页数：42 Pages

TI

德州仪器

丝印：62D02；Package：SOT-23-THIN；TPS3762 65 V Window (OV & UV) Supervisor with Built-In Self-Test and Latch

1 Features • SIL-3 Functional Safety-compliant product targeted – Documentation to aid IEC 61508 system design – Systematic capability up to SIL-3 targeted – Hardware capability up to SIL-3 targeted • Device flexibility to meet design requirements – Wide voltage threshold range: 2.7 V to 60

文件：2.19741 Mbytes 页数：42 Pages

TI

德州仪器

丝印：62D02；Package：SOT-23-THIN；TPS3762-Q1 Automotive 65V Window (OV & UV) Supervisor with Built-In Self-Test and Latch

1 Features • ASIL-D Functional Safety-Compliant – Documentation to aid ISO 26262 system design – Systematic capability up to ASIL-D – Hardware capability up to ASIL-D • AEC-Q100 qualified for automotive applications – Device temperature grade 1: –40°C to +125°C • Device flexibility to meet

文件：2.29306 Mbytes 页数：46 Pages

TI

德州仪器

TPS3762-Q1 Automotive 65V Window (OV & UV) Supervisor with Built-In Self-Test and Latch

1 Features • ASIL-D Functional Safety-Compliant – Documentation to aid ISO 26262 system design – Systematic capability up to ASIL-D – Hardware capability up to ASIL-D • AEC-Q100 qualified for automotive applications – Device temperature grade 1: –40°C to +125°C • Device flexibility to meet

文件：2.29306 Mbytes 页数：46 Pages

TI

德州仪器

TPS3762-Q1 Automotive Wide VIN 65 V Window (OV & UV) Supervisor with Built-In Self-Test

1 Features • ASIL-D Functional Safety-Compliant targeted – Development targeted for Functional Safety applications – Documentation to aid ISO 26262 system design – Systematic capability up to ASIL-D targeted – Hardware capability up to ASIL-D targeted • AEC-Q100 qualified for automotive app

文件：2.11189 Mbytes 页数：38 Pages

TI

德州仪器

TPS3762-Q1 Automotive 65V Window (OV & UV) Supervisor with Built-In Self-Test and Latch

1 Features • ASIL-D Functional Safety-Compliant – Documentation to aid ISO 26262 system design – Systematic capability up to ASIL-D – Hardware capability up to ASIL-D • AEC-Q100 qualified for automotive applications – Device temperature grade 1: –40°C to +125°C • Device flexibility to meet

文件：2.29306 Mbytes 页数：46 Pages

TI

德州仪器