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SCANSTA111中文资料增强型 SCAN 桥多点可寻址 IEEE 1149.1 (JTAG) 端口数据手册TI规格书

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厂商型号

SCANSTA111

参数属性

SCANSTA111 封装/外壳为48-TFSOP(0.240",6.10mm 宽);包装为卷带(TR)剪切带(CT)Digi-Reel® 得捷定制卷带;类别为集成电路(IC)的专用;SCANSTA111应用范围:测试设备;产品描述:IC INTERFACE SPECIALIZED 48TSSOP

功能描述

增强型 SCAN 桥多点可寻址 IEEE 1149.1 (JTAG) 端口

封装外壳

48-TFSOP(0.240",6.10mm 宽)

制造商

TI Texas Instruments

中文名称

德州仪器 美国德州仪器公司

数据手册

下载地址下载地址二

更新时间

2025-9-28 16:22:00

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SCANSTA111规格书详情

描述 Description

The SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a multidrop approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to the remaining modules. Each SCANSTA111 supports up to 3 local IEEE 1149.1 scan rings which can be accessed individually or combined serially. Addressing is accomplished by loading the instruction register with a value matching that of the Slot inputs. Backplane and inter-board testing can easily be accomplished by parking the local TAP Controllers in one of the stable TAP Controller states via a Park instruction. The 32-bit TCK counter enables built in self test operations to be performed on one port while other scan chains are simultaneously tested.

特性 Features

• True IEEE 1149.1 Hierarchical and Multidrop Addressable Capability
• The 7 Slot Inputs Support Up to 121 Unique Addresses, an Interrogation Address, Broadcast Address, and 4 Multi-Cast Group Addresses (Address 000000 is Reserved)
• 3 IEEE 1149.1-Compatible Configurable Local Scan Ports
• Mode Register0 Allows Local TAPs to be Bypassed, Selected for Insertion Into the Scan Chain Individually, or Serially in Groups of Two or Three
• Transparent Mode can be Enabled with a Single Instruction to Conveniently Buffer the Backplane IEEE 1149.1 Pins to those on a Single Local Scan Port
• LSP ACTIVE Outputs Provide Local Port Enable Signals for Analog Busses Supporting IEEE 1149.4.
• General Purpose Local Port Pass-Through Bits are Useful for Delivering Write Pulses for FPGA Programming or Monitoring Device Status.
• Known Power-Up State
• TRST on All Local Scan Ports
• 32-Bit TCK Counter
• 16-Bit LFSR Signature Compactor
• Local TAPs can become TRI-STATE via the OE Input to Allow an Alternate Test Master to Take Control of the Local TAPs (LSP0-2 Have a TRI-STATE Notification Output)
• 3.0-3.6V VCC Supply Operation
• Power-Off High Impedance Inputs and Outputs
• Supports Live Insertion/Withdrawal

技术参数

  • 产品编号:

    SCANSTA111MT/NOPB

  • 制造商:

    Texas Instruments

  • 类别:

    集成电路(IC) > 专用

  • 包装:

    卷带(TR)剪切带(CT)Digi-Reel® 得捷定制卷带

  • 应用:

    测试设备

  • 接口:

    IEEE 1149.1

  • 电压 - 供电:

    3V ~ 3.6V

  • 封装/外壳:

    48-TFSOP(0.240",6.10mm 宽)

  • 供应商器件封装:

    48-TSSOP

  • 安装类型:

    表面贴装型

  • 描述:

    IC INTERFACE SPECIALIZED 48TSSOP

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