Wireless Audio Module

文件：600.2 Kbytes 页数：36 Pages

DIALOGDialog Semiconductor

戴乐格

Wireless Audio Module

文件：600.2 Kbytes 页数：36 Pages

DIALOGDialog Semiconductor

戴乐格

Wireless Audio Module

文件：600.2 Kbytes 页数：36 Pages

DIALOGDialog Semiconductor

戴乐格

丝印：SC14WAMDECTSF；Package：MOD88；Wireless Audio Module

文件：600.2 Kbytes 页数：36 Pages

DIALOGDialog Semiconductor

戴乐格

丝印：SC14SEP；Package：TSSOP；SN54SC6T14-SEP Radiation Tolerant, Hex Schmitt-Trigger Inverters With Integrated Translation

1 Features • Vendor item drawing available, VID V62/24618 • Total ionizing dose characterized at 30 krad (Si) – Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad (Si) • Single-event effects (SEE) characterized: – Single event latch-up (SEL) immun

文件：1.01832 Mbytes 页数：24 Pages

TI

德州仪器

丝印：SC14SEP；Package：TSSOP；SN54SC6T14-SEP Radiation Tolerant, Hex Schmitt-Trigger Inverters With Integrated Translation

1 Features • Vendor item drawing available, VID V62/24618 • Total ionizing dose characterized at 30 krad (Si) – Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad (Si) • Single-event effects (SEE) characterized: – Single event latch-up (SEL) immun

文件：1.0147 Mbytes 页数：23 Pages

TI

德州仪器

丝印：SC14SEP；Package：TSSOP；SN54SC6T14-SEP Radiation Tolerant, Hex Schmitt-Trigger Inverters With Integrated Translation

1 Features • Vendor item drawing available, VID V62/24618 • Total ionizing dose characterized at 30 krad (Si) – Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad (Si) • Single-event effects (SEE) characterized: – Single event latch-up (SEL) immun

文件：1.01832 Mbytes 页数：24 Pages

TI

德州仪器

丝印：SC14SEP；Package：TSSOP；SN54SC6T14-SEP Radiation Tolerant, Hex Schmitt-Trigger Inverters With Integrated Translation

1 Features • Vendor item drawing available, VID V62/24618 • Total ionizing dose characterized at 30 krad (Si) – Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad (Si) • Single-event effects (SEE) characterized: – Single event latch-up (SEL) immun

文件：1.01832 Mbytes 页数：24 Pages

TI

德州仪器

微型扬声器、受话器

• Impedance: 32±15% Ω \n\n• Sound Pressure Level : 119±3dB \n\n• (0.179Vrms, @1kHz IEC318) \n\n• Rated Noise Power: 5mW \n\n• Max. Short Term Power: 10mW F0 (without mesh, in free air): 280±15% Hz;

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共达电声

HIGH PERFORMANCE SYNCHRONOUS BUCK CONTROLLER WITH LDO FOR PORTABLE POWER

Semtech

先之科