丝印：S595SEP；Package：TSSOP；SN54SC8T595-SEP Radiation Tolerant 8-Bit Shift Registers With 3-State Output And Logic Level Shifter

1 Features • Vendor item drawing available, VID V62/25621-01XE • Radiation - Total Ionizing Dose (TID): – TID characterized up to 50krad(Si) – TID performance assurance up to 30krad(Si) – Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si) • Radiation - Single-Even

文件：1.15481 Mbytes 页数：29 Pages

TI

德州仪器