NE5537D数据手册恩XP中文资料规格书

描述 Description

DESCRIPTION
The NE5537 monolithic sample-and-hold amplifier combines the best features of ion-implanted JFETs with bipolar devices to obtain high accuracy, fast acquisition time, and low droop rate. This device is pin-compatible with the LF198, and features superior performance in droop rate and output drive capability.FEATURES
•Operates from ±5V to ±18V supplies
•Hold leakage current 6pA @ TJ= 25°C
•Less than 4µs acquisition time
•TTL, PMOS, CMOS compatible logic input
•0.5mV typical hold step at CH=0.01µF
•Low input offset: 1MV (typical)
•0.002% gain accuracy with RL=2kΩ
•Low output noise in hold mode
•Input characteristics do not change during hold mode
•High supply rejection ratio in sample or hold
•Wide bandwidth

特性 Features

•Operates from ±5V to ±18V supplies
•Hold leakage current 6pA @ TJ= 25°C
•Less than 4µs acquisition time
•TTL, PMOS, CMOS compatible logic input
•0.5mV typical hold step at CH=0.01µF
•Low input offset: 1MV (typical)
•0.002% gain accuracy with RL=2kΩ
•Low output noise in hold mode
•Input characteristics do not change during hold mode
•High supply rejection ratio in sample or hold
•Wide bandwidth