首页>LMG3522R030>规格书详情

LMG3522R030中文资料PDF规格书

LMG3522R030
厂商型号

LMG3522R030

功能描述

LMG3522R030 650-V 30-mΩ GaN FET With Integrated Driver, Protection, and Temperature Reporting

文件大小

2.43235 Mbytes

页面数量

39

生产厂商 Texas Instruments
企业简称

TI德州仪器

中文名称

美国德州仪器公司官网

原厂标识
数据手册

下载地址一下载地址二原厂数据手册到原厂下载

更新时间

2024-6-2 18:00:00

LMG3522R030规格书详情

1 Features

• 650-V GaN-on-Si FET with integrated gate driver

– Integrated high precision gate bias voltage

– 200-V/ns FET hold-off

– 2-MHz switching frequency

– 20-V/ns to 150-V/ns slew rate for optimization

of switching performance and EMI mitigation

– Operates from 7.5-V to 18-V supply

• Robust protection

– Cycle-by-cycle overcurrent and latched shortcircuit

protection with < 100-ns response

– Withstands 720-V surge while hard-switching

– Self-protection from internal overtemperature

and UVLO monitoring

• Advanced power management

– Digital temperature PWM output

• Top-side cooled 12-mm × 12-mm VQFN package

separates electrical and thermal paths for lowest

power loop inductance

2 Applications

• Switch-mode power converters

• Merchant network and server PSU

• Merchant telecom rectifiers

• Solar inverters and industrial motor drives

• Uninterruptable power supplies

3 Description

The LMG3522R030 GaN FET with integrated driver

and protections is targeting switch-mode power

converters and enables designers to achieve new

levels of power density and efficiency.

The LMG3522R030 integrates a silicon driver that

enables switching speed up to 150 V/ns. TI’s

integrated precision gate bias results in higher

switching SOA compared to discrete silicon gate

drivers. This integration, combined with TI's lowinductance

package, delivers clean switching and

minimal ringing in hard-switching power supply

topologies. Adjustable gate drive strength allows

control of the slew rate from 20 V/ns to 150 V/ns,

which can be used to actively control EMI and

optimize switching performance.

Advanced power management features include digital

temperature reporting and fault detection. The

temperature of the GaN FET is reported through

a variable duty cycle PWM output, which simplifies

managing device loading. Faults reported include

overtemperature, overcurrent, and UVLO monitoring.

供应商 型号 品牌 批号 封装 库存 备注 价格
Texas
21+
25000
原厂原包 深圳现货 主打品牌 假一赔百 可开票!
询价
TI(德州仪器)
23+
N/A
589610
新到现货 原厂一手货源 价格秒杀代理!
询价
TI
QFM|9
70230
16余年资质 绝对原盒原盘 更多数量
询价
TI/德州仪器
22+
QFM-9
13000
原装正品
询价
原厂正品
23+
DIP16
5000
原装正品,假一罚十
询价
2322+
NA
33220
无敌价格 主销品牌 正规渠道订货 免费送样!!!
询价
TI/德州仪器
22+
QFM-9
9600
原装现货,优势供应,支持实单!
询价
N/A
2021+
SMD
100500
一级代理专营品牌!原装正品,优势现货,长期排单到货
询价
TI
16+
QFM
10000
原装正品
询价
TI
23+
NA
741
门极驱动器
询价