丝印：LC132Q；Package：WQFN；SN74LVC132A-Q1 Automotive Quadruple 2-Input NAND Gates with Schmitt-Trigger Inputs

1 Features • AEC-Q100 qualified for automotive applications: – Device temperature grade 1: -40°C to +125°C – Device HBM ESD classification level 2 – Device CDM ESD classification level C4B • Available in wettable flank QFN (WBQA) package • Operating range from 1.1V to 3.6V • 5.5V tolerant i

文件：1.58275 Mbytes 页数：26 Pages

TI

德州仪器

丝印：LC132Q；Package：WQFN；SN74LVC132A-Q1 Automotive Quadruple 2-Input NAND Gates with Schmitt-Trigger Inputs

1 Features • AEC-Q100 qualified for automotive applications: – Device temperature grade 1: -40°C to +125°C – Device HBM ESD classification level 2 – Device CDM ESD classification level C4B • Available in wettable flank QFN (WBQA) package • Operating range from 1.1V to 3.6V • 5.5V tolerant i

文件：1.81152 Mbytes 页数：30 Pages

TI

德州仪器