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CD74HC4017QM96EP

Marking:HC4017E;Package:SOIC;HIGH-SPEED CMOS LOGIC DECADE COUNTER/DIVIDER WITH 10 DECODED OUTPUTS

ControlledBaseline −OneAssembly/TestSite,OneFabrication Site ExtendedTemperaturePerformanceof −40°Cto125°C EnhancedDiminishingManufacturing Sources(DMS)Support EnhancedProduct-ChangeNotification QualificationPedigree† FullyStaticOperation BufferedInputs CommonReset

TI2Texas Instruments

德州仪器美国德州仪器公司

CD74HC4017QM96EP.A

Marking:HC4017E;Package:SOIC;HIGH-SPEED CMOS LOGIC DECADE COUNTER/DIVIDER WITH 10 DECODED OUTPUTS

ControlledBaseline −OneAssembly/TestSite,OneFabrication Site ExtendedTemperaturePerformanceof −40°Cto125°C EnhancedDiminishingManufacturing Sources(DMS)Support EnhancedProduct-ChangeNotification QualificationPedigree† FullyStaticOperation BufferedInputs CommonReset

TI2Texas Instruments

德州仪器美国德州仪器公司

CD74HC4017QPWREP

Marking:HC4017E;Package:TSSOP;HIGH-SPEED CMOS LOGIC DECADE COUNTER/DIVIDER WITH 10 DECODED OUTPUTS

ControlledBaseline −OneAssembly/TestSite,OneFabrication Site ExtendedTemperaturePerformanceof −40°Cto125°C EnhancedDiminishingManufacturing Sources(DMS)Support EnhancedProduct-ChangeNotification QualificationPedigree† FullyStaticOperation BufferedInputs CommonReset

TI2Texas Instruments

德州仪器美国德州仪器公司

CD74HC4017QPWREP.A

Marking:HC4017E;Package:TSSOP;HIGH-SPEED CMOS LOGIC DECADE COUNTER/DIVIDER WITH 10 DECODED OUTPUTS

ControlledBaseline −OneAssembly/TestSite,OneFabrication Site ExtendedTemperaturePerformanceof −40°Cto125°C EnhancedDiminishingManufacturing Sources(DMS)Support EnhancedProduct-ChangeNotification QualificationPedigree† FullyStaticOperation BufferedInputs CommonReset

TI2Texas Instruments

德州仪器美国德州仪器公司

V62SLASH04703-01XE

Marking:HC4017E;Package:SOIC;HIGH-SPEED CMOS LOGIC DECADE COUNTER/DIVIDER WITH 10 DECODED OUTPUTS

ControlledBaseline −OneAssembly/TestSite,OneFabrication Site ExtendedTemperaturePerformanceof −40°Cto125°C EnhancedDiminishingManufacturing Sources(DMS)Support EnhancedProduct-ChangeNotification QualificationPedigree† FullyStaticOperation BufferedInputs CommonReset

TI2Texas Instruments

德州仪器美国德州仪器公司

V62SLASH04703-01YE

Marking:HC4017E;Package:TSSOP;HIGH-SPEED CMOS LOGIC DECADE COUNTER/DIVIDER WITH 10 DECODED OUTPUTS

ControlledBaseline −OneAssembly/TestSite,OneFabrication Site ExtendedTemperaturePerformanceof −40°Cto125°C EnhancedDiminishingManufacturing Sources(DMS)Support EnhancedProduct-ChangeNotification QualificationPedigree† FullyStaticOperation BufferedInputs CommonReset

TI2Texas Instruments

德州仪器美国德州仪器公司

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