FSJ9055D1中文资料INTERSIL数据手册PDF规格书

描述 Description

The Discrete Products Operation of Harris Semiconductor has developed a series of Radiation Hardened MOSFETs specifically designed for commercial and military space applications. Enhanced Power MOSFET immunity to Single Event Effects (SEE), Single Event Gate Rupture (SEGR) in particular, is combined with 100K RADS of total dose hardness to provide devices which are ideally suited to harsh space environments. The dose rate and neutron tolerance necessary for military applications have not been sacrificed.

特性 Features

• 55A, -60V, rDS(ON) = 0.029Ω

• Total Dose

    - Meets Pre-RAD Specifications to 100K RAD (Si)

• Single Event

    - Safe Operating Area Curve for Single Event Effects

    - SEE Immunity for LET of 36MeV/mg/cm2 with VDS up to 80 of Rated Breakdown and VGS of 10V Off-Bias

• Dose Rate

    - Typically Survives 3E9 RAD (Si)/s at 80 BVDSS

    - Typically Survives 2E12 if Current Limited to IDM

• Photo Current

    - 6.0nA Per-RAD(Si)/s Typically

• Neutron

    - Maintain Pre-RAD Specifications for 3E13 Neutrons/cm2

    - Usable to 3E14 Neutrons/cm2