Two-Wire Hall-Effect Latch with Advanced Diagnostics

FEATURES AND BENEFITS • Functional safety ▫ Developed in accordance with ISO 26262:2011 (pending assessment) ▫ Designed to meet ASIL B requirements ▫ Integrated background diagnostics for: ◦ Signal path ◦ Regulator ◦ Hall plate and bias ◦ Overtemperature detection ◦ Nonvolatile memory ▫

文件：1.042 Mbytes 页数：18 Pages

ALLEGRO

2-Wire Hall Effect Latch Family with Advanced Diagnostics

The APS12800 device is a two-wire planar Hall-effect latch integrated circuit family developed in accordance with ISO 26262:2011. It includes internal diagnostics and a safe state that support a functional safety level of ASIL B when integrated and used in conjunction with the appropriate system-lev • ASIL-B\n• Several magnetic switchpoints and switching behavior options\n• Wide supply voltage range 3-24 V\n•  AEC-Q100\n• TJ up to 175C\n• ±8 kV ESD Rating (HBM)\n• 40 V Load Dump compliance;

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Two-Wire Hall-Effect Latch with Advanced Diagnostics

FEATURES AND BENEFITS • Functional safety ▫ Developed in accordance with ISO 26262:2011 (pending assessment) ▫ Designed to meet ASIL B requirements ▫ Integrated background diagnostics for: ◦ Signal path ◦ Regulator ◦ Hall plate and bias ◦ Overtemperature detection ◦ Nonvolatile memory ▫

文件：1.042 Mbytes 页数：18 Pages

ALLEGRO

Two-Wire Hall-Effect Latch with Advanced Diagnostics

FEATURES AND BENEFITS • Functional safety ▫ Developed in accordance with ISO 26262:2011 (pending assessment) ▫ Designed to meet ASIL B requirements ▫ Integrated background diagnostics for: ◦ Signal path ◦ Regulator ◦ Hall plate and bias ◦ Overtemperature detection ◦ Nonvolatile memory ▫

文件：1.042 Mbytes 页数：18 Pages

ALLEGRO

Two-Wire Hall-Effect Latch with Advanced Diagnostics

FEATURES AND BENEFITS • Functional safety ▫ Developed in accordance with ISO 26262:2011 (pending assessment) ▫ Designed to meet ASIL B requirements ▫ Integrated background diagnostics for: ◦ Signal path ◦ Regulator ◦ Hall plate and bias ◦ Overtemperature detection ◦ Nonvolatile memory ▫

文件：1.042 Mbytes 页数：18 Pages

ALLEGRO

Two-Wire Hall-Effect Latch with Advanced Diagnostics

FEATURES AND BENEFITS • Functional safety ▫ Developed in accordance with ISO 26262:2011 (pending assessment) ▫ Designed to meet ASIL B requirements ▫ Integrated background diagnostics for: ◦ Signal path ◦ Regulator ◦ Hall plate and bias ◦ Overtemperature detection ◦ Nonvolatile memory ▫

文件：1.042 Mbytes 页数：18 Pages

ALLEGRO

Two-Wire Hall-Effect Latch with Advanced Diagnostics

FEATURES AND BENEFITS • Functional safety ▫ Developed in accordance with ISO 26262:2011 (pending assessment) ▫ Designed to meet ASIL B requirements ▫ Integrated background diagnostics for: ◦ Signal path ◦ Regulator ◦ Hall plate and bias ◦ Overtemperature detection ◦ Nonvolatile memory ▫

文件：1.042 Mbytes 页数：18 Pages

ALLEGRO

Two-Wire Hall-Effect Latch with Advanced Diagnostics

FEATURES AND BENEFITS • Functional safety ▫ Developed in accordance with ISO 26262:2011 (pending assessment) ▫ Designed to meet ASIL B requirements ▫ Integrated background diagnostics for: ◦ Signal path ◦ Regulator ◦ Hall plate and bias ◦ Overtemperature detection ◦ Nonvolatile memory ▫

文件：1.042 Mbytes 页数：18 Pages

ALLEGRO

Two-Wire Hall-Effect Latch with Advanced Diagnostics

FEATURES AND BENEFITS • Functional safety ▫ Developed in accordance with ISO 26262:2011 (pending assessment) ▫ Designed to meet ASIL B requirements ▫ Integrated background diagnostics for: ◦ Signal path ◦ Regulator ◦ Hall plate and bias ◦ Overtemperature detection ◦ Nonvolatile memory ▫

文件：1.042 Mbytes 页数：18 Pages

ALLEGRO

Two-Wire Hall-Effect Latch with Advanced Diagnostics

FEATURES AND BENEFITS • Functional safety ▫ Developed in accordance with ISO 26262:2011 (pending assessment) ▫ Designed to meet ASIL B requirements ▫ Integrated background diagnostics for: ◦ Signal path ◦ Regulator ◦ Hall plate and bias ◦ Overtemperature detection ◦ Nonvolatile memory ▫

文件：1.042 Mbytes 页数：18 Pages

ALLEGRO