Two-Wire Hall-Effect Latch with Advanced Diagnostics

FEATURES AND BENEFITS • Functional safety ▫ Developed in accordance with ISO 26262:2011 (pending assessment) ▫ Designed to meet ASIL B requirements ▫ Integrated background diagnostics for: ◦ Signal path ◦ Regulator ◦ Hall plate and bias ◦ Overtemperature detection ◦ Nonvolatile memory ▫

文件：1.042 Mbytes 页数：18 Pages

ALLEGRO

SOT23-5

NA

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SOT-23-5

芯朋微

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固态硬盘 - SSD

Apacer

宇瞻

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SMD

NCC/黑金刚

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