Si470X/1X/2X/3X/4X EVALUATION BOARD TEST PROCEDURE

Introduction The purpose of this document is to describe the test procedures used in Silicon Laboratories for the Si470x/1x/2x/3x/4x evaluation boards (EVB). It is also intended to enable customers to exactly replicate Silicon Laboratories’ test environment so that variances in customers’ and S

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Si470X/1X/2X/3X/4X EVALUATION BOARD TEST PROCEDURE

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