丝印：AHCT541EP；Package：SOIC；OCTAL BUFFER/DRIVER | WITH 3-STATE OUTPUTS

Controlled Baseline − One Assembly/Test Site, One Fabrication Site Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† Inputs Are TTL-Voltage Compatible Latch-Up Performance Exceeds 250 mA Per JESD 17 ESD Protection Exceed

文件：768.15 Kbytes 页数：16 Pages

TI

德州仪器

丝印：AHCT541EP；Package：SOIC；OCTAL BUFFER/DRIVER | WITH 3-STATE OUTPUTS

Controlled Baseline − One Assembly/Test Site, One Fabrication Site Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† Inputs Are TTL-Voltage Compatible Latch-Up Performance Exceeds 250 mA Per JESD 17 ESD Protection Exceed

文件：768.15 Kbytes 页数：16 Pages

TI

德州仪器

丝印：AHCT541EP；Package：SOIC；OCTAL BUFFER/DRIVER | WITH 3-STATE OUTPUTS

Controlled Baseline − One Assembly/Test Site, One Fabrication Site Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† Inputs Are TTL-Voltage Compatible Latch-Up Performance Exceeds 250 mA Per JESD 17 ESD Protection Exceed

文件：768.15 Kbytes 页数：16 Pages

TI

德州仪器