丝印：AHCT541EP；Package：SOIC；OCTAL BUFFER/DRIVER | WITH 3-STATE OUTPUTS

Controlled Baseline − One Assembly/Test Site, One Fabrication Site Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† Inputs Are TTL-Voltage Compatible Latch-Up Performance Exceeds 250 mA Per JESD 17 ESD Protection Exceed

文件：768.15 Kbytes 页数：16 Pages

TI

德州仪器

丝印：AHCT541EP；Package：SOIC；OCTAL BUFFER/DRIVER | WITH 3-STATE OUTPUTS

Controlled Baseline − One Assembly/Test Site, One Fabrication Site Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† Inputs Are TTL-Voltage Compatible Latch-Up Performance Exceeds 250 mA Per JESD 17 ESD Protection Exceed

文件：768.15 Kbytes 页数：16 Pages

TI

德州仪器

丝印：AHCT541Q；Package：TSSOP(PW)；SN74AHCT541-Q1 Automotive Octal Buffers/Drivers With 3-State Outputs

1 Features • AEC-Q100 qualified for automotive applications: – Device temperature grade 1: -40°C to +125°C – Device HBM ESD classification level 2 – Device CDM ESD classification level C4B • Available in wettable flank QFN package • Operating range 4.5V to 5.5V VCC • TTL-Compatible inputs

文件：1.61442 Mbytes 页数：32 Pages

TI

德州仪器

丝印：AHCT541EP；Package：SOIC；OCTAL BUFFER/DRIVER | WITH 3-STATE OUTPUTS

Controlled Baseline − One Assembly/Test Site, One Fabrication Site Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† Inputs Are TTL-Voltage Compatible Latch-Up Performance Exceeds 250 mA Per JESD 17 ESD Protection Exceed

文件：768.15 Kbytes 页数：16 Pages

TI

德州仪器

丝印：AHCT541EP；Package：SOIC；OCTAL BUFFER/DRIVER | WITH 3-STATE OUTPUTS

Controlled Baseline − One Assembly/Test Site, One Fabrication Site Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† Inputs Are TTL-Voltage Compatible Latch-Up Performance Exceeds 250 mA Per JESD 17 ESD Protection Exceed

文件：768.15 Kbytes 页数：16 Pages

TI

德州仪器